Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics
نویسنده
چکیده
A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Ka, Cu Ka and Mo Ka radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated. D 2005 Elsevier B.V. All rights reserved.
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